Jonas & Redmann - WIS - Wafer Inspection System - Brochure
WAFER INSPECTION SYSTEMThe Automation Companyproven measuring and sorting system for silicon solar wafersmodular design including devices for loading and unloading, inspecting, sorting, process linkage wafer inline check up to the edge e.g. saw mark, contamination and edge thickness variation detectionperfect adaption of automation to measurement ...