New K&S Inspection Process for Identification Of Technical Problems at Thin Film PV Systems
Optimizing photovoltaic systems
09.03.2015, Munich -- Thin-film PV modules differ technically from crystalline silicon modules. Such modules are for a different spectral sensitivities, ie they can handle light of different wavelengths differently well, on the other hand they have different stability properties. During the construction or during plant operation with thin-film PV modules are technical particularities of the installation, system monitoring and the module type used by different manufacturers (eg First Solar, Sharp, Solar Frontier, etc.) must be observed.
The specially developed new K&S review process to identify performance problems with PV systems with thin-film PV modules is based on analysis methods such as thermography and U/I characteristic measurements. Systematic analysis approach with special algorithms in combination with the great experience of K&S offers the possibility yield problems as quickly as possible to identify and develop cost-optimal countermeasures. The K&S standard process has already been successfully applied in many thin-film PV plants in Italy, France and Germany.
The K&S Engineering partnership is represented by projects in the field of renewable energy worldwide, providing reliable technical advice from technical due diligence, project support to final technical inspection.
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