Hitachi High-Tech - Model X-Strata920 - Coating Thickness Measurement and Materials Analysis
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Reliable Coatings Analysis
The X-Strata920 offers three configurations to fit parts of any shape. The slotted chamber fits small parts as well as long, skinny samples, the mini-well chamber gives you the flexibility to measure taller parts. Choose the motorised, programmable stage to automatically measure multiple samples or various locations on a single PCB.
The X-Strata920 is a great tool for ensuring target specifications are met while reducing costs by avoiding over-plating and re-work. The operator simply loads the samples and positions it under the on-screen target, aligns it using the laser focus and starts the measurement. Results are displayed in seconds and the operator can then quickly move he next task. You will have confidence in the thanks to the optimised calibrations created with traceable standards.
Use the X-Strata920 to conform to industry norms such as IPC-4552A, ISO 3497, ASTM B568 and DIN 50987.
Why X-Strata?
The coating thickness measurement analyser X-Strata range offers:
- Non-destructive analysis: no sample preparation
- Field-proven technology and reliability ensuring value for money year after year
- Easy to use, with minimal user training required
- Analysis in only three simple steps
- Outstanding precision and accuracy of analysis
- Culmination of over 20 years knowledge and experience in the coatings industry
Coating thickness measurement with the powerful and easy to use XRF spectrometer guarantees quality and reduces costs.
Benefits
- High performance XRF spectrometer
- Fast and precise analysis
- 50-watt micro-focus X-ray tube (providing a high-intensity, small-spot X-ray beam for superior sample excitation) delivers optimum sensitivity
- Simple element differentiation: secondary beam filters enable the spectral separation of overlapping elements
- Optimised performance across a wide range of elements
- Rugged and robust design
- Operation in a laboratory or by the production line
- Sturdy, industrial design
Simple calibration setup
- Fundamental Parameters (FP) methods provide simplicity and reliable quantitative results when no calibration
- standards are available
- Empirical calibrations provide best accuracy and results traceability, and use only a few standards
- Methods are created in minutes
- Hitachi High-tech Analytical Science supply certified standards for best accuracy (A2LA and ISO/IEC 17025 accredited)
- X-Strata920 is supplied with over 800 pre-loaded, easy-to-select application parameters/methods
- Excellent long-term stability:
- Automatic thermal compensation measures the instrument temperature and corrects for changes, giving stable results
- Simple and rapid Spectrum Calibration routine checks the instrument performance (such as sensitivity) and applies necessary corrections
Markets and Industries
Electronics - Increase productivity with better process control
- Analysis of gold and palladium thickness of electrical contacts, for example Au/Ni/Cu
- Measurement of solderability on printed circuit boards such as Ag/Cu/Epoxy
Metal Finishing - Minimise production cost of the plating process and maximise production output
- Multi sample and multi point analysis
- Single or multi layer thickness measurement
- Plating bath analysis
Precious Metals / Metal Alloys - Rapid, non-destructive analysis of jewellery and other alloys
- Gold analysis, i.e. Karat and other elements determination
- Precious metal alloy assay
Compliance testing - Ensure products conform to specifications
- Determination of hazardous substances from ppm to high % levels
- Quantification of toxic elements e.g. Cd, Hg, Pb etc to verify compliance
- RoHS screening following IEC62321
- High reliability testing for aerospace - positive identification of leaded solder
Alternative Energy - Ensure product efficiency and uniformity
- Thin-film photovoltaic cells - composition analysis of the thin-film absorber layer (e.g. CIS, CIGS, CdTe)
- Optimised electrical conductivity through layer thickness analysis
Coating Thickness Analysers - X-Strata Range
X-Strata920 – Cost-effective, non-destructive and reliable
A simple to use, quality control analyser for coating thickness and materials analysis.
- New modern design
- Rapid measurement (seconds) from one to four coating layers
- Range of hardware configurations, i.e. Standard base, Minwell, or automated table to cover a wide range of sample types
- “Slotted Chamber” to measure large area samples, e.g. printed circuit boards, flat sheets etc
- Compliance with ISO3487 and ASTM B568 test methods
X-Strata980 – Flexible, multi-element, non-destructive materials analysis
A comprehensive, powerful XRF analyser measuring a wide range of samples - very small to large.
- Fast, accurate analysis on solids, liquids and powders
- Large sample chamber with programmable base for ease of loading and measurement (option)
- Integrated PC for minimal bench space
- High resolution detector for lowest detection limits
- Wide range of applications including photovoltaic cells, RoHS and precious metals
X-Strata920 - Three Configurations
X-Strata920 - Three Configurations to suit your needs:
Standard base
- A “slotted chamber” allows the measurement of a wide range of samples from small components to very large flat samples, e.g. printed circuit board. The size of the sample can exceed the width of the instrument
- Economical and practical
- For the analysis of samples up to 33mm (1.3”) in height
Mini-well base
- The “Mini-Well” chamber design allows the measurement of a wide range of parts/components from small to large, i.e. up to 160mm (6.3”) in height
- Sample tray which can be positioned in one of four positions in the “Mini-Well” to hold samples of differing height, ensuring a range of parts/components can be measured with ease
- A 'slotted chamber' allows the measurement of large flat samples, e.g. printed circuit boards whose size can exceed the width of the instrument
Programmable XY base
- A motorised and programmable table allows automatic measurements for highest sample throughput and unattended operation.
- Mouse control enables easy positioning of the parts/components being analysed to the precise points for analysis
- The 'Slotted chamber' allows large flat samples to be measured, e.g. printed circuit boards
- Table size: 56mm (22') D x 61mm (24') W
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