Solar Metrology Equipment For Solar Energy
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Manufactured by E+H Metrology GmbHbased in GERMANY
Automatic wafer geometry gauge.Wafer diameter 2', 3' and 4'.Thickness range 200 - 800µm.Accuracy 1µm.Resolution 0.1µm.Software ...
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Manufactured by Eigenbrodt GmbH & Co. KGbased in GERMANY
Measuring solar radiation under certain circumstances like rain, dew, snow or frost can be quite challenging, because debris falsifies the results. Reliability and accurateness of solar measurements is being enhanced by the use of the SBL 480 van, since the debris can be reduced or even completely avoided. A continuously and equally heated dome additionally allows reducing the cooling effects ...
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Manufactured by E+H Metrology GmbHbased in GERMANY
The thickness and warp measurements are performed in two consecutive stages.In the first stage, the warp measurement, the upper probe head is in the raised position, the air gap between the probe heads is wide, and the wafer is resting freely on the surface of the lower probe head. Only the distance sensors of the lower probe head are used for measuring. The wafer shape measured under these ...
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Manufactured by LayTec AGbased in GERMANY
In solar modules, the ethylene vinyl acetate (EVA) or polyolefin encapsulation protects the sensitive solar cells from the environment. In consequence the degree of intermolecular cross-linking of EVA or polyolefin is decisive for the long-term stability and performance of a module. Cross-linking is achieved by thermally curing the polymers during the lamination process. ...
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Manufactured by Abet Technologies, Inc.based in USA
Multi-Junction solar cell metrology is more complicated than that of a single junction one. As these cells are made of multiple layers, a multi-source/LED solar simulator is usually employed to allow adjustment of band to band irradiance ratios. Our triple junction reference cells can be used to set the correct irradiance for each single ...
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