Multi-Wavelength Ellipsometers for Thin Film Measurements

Innovative
The Film Sense Multi-Wavelength Ellipsometers use long-life LED’s and a no-moving-parts ellipsometric detector to provide fast and reliable thin film measurements in an easy-to-use, compact system.

Powerful
The film thickness of most transparent thin films from 0 – 5000 nm can be determined with excellent precision and accuracy by a simple 1 second measurement. Optical constants n & k and other film properties can also be measured for many samples.

Affordable
Film Sense offers the power of Multi-Wavelength Technology, but at the price point of single wavelength ellipsometer and spectroscopic reflectometer systems. Film Sense is ideal for measurements in the research lab, classroom, in situ process control, industrial quality control, and more.

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