Hiden Analytical Ltd. applications

Hiden gas/vapour analysers, optimized specifically for fuel cell research, offer a number of key benefits over other analysis techniques: rapid response (critical for temperature programmed studies), wide dynamic range, repeatability and linearity, are all of the up most importance when analyzing processes - particularly those in the presence of hydrogen - with widely varying gas concentrations. These features provide for accurate, stable and reproducible analysis of low molecular weight species, over a wide concentration range, present in a hydrogen rich atmosphere, and are found to be invaluable in applications such as the conversion of hydrocarbons, or alcohols, to hydrogen (reformers) for use in Proton Exchange Membrane (PEM) Fuel Cells.

Hiden plasma probes measure some of the key plasma parameters and provide detailed information relating to plasma reaction chemistry. Plasma diagnostics for applications in etching, deposition, coating and surface modification. ECR – Electron Cyclotron Resonance plasma Magnetron sputtering High power impulse magnetron sputtering, HIPIMS ICP inductively coupled plasma, and RF plasma Dielectric-barrier discharge (DBD)

SIMS - for depth profiling, surface composition measurement, and elemental imaging, Hiden's SIMS Workstation provides a complete analytical facility. RGA - The Hiden quadrupole mass spectrometers provide high sensitivity detection capability for the most demanding XHV/UHV vacuum environments. The pulse ion counting detector enables measurement of both positive and negative ions through 7 continuous decades, the integral accumulation mode being used for the capture of discreet particle events. UHV Temperature Programmed desorption studies (TPD) - Hiden Analytical’s 3F/PIC mass spectrometers with pulse ion counting detection are available configured specifically for UHVTPD providing fast, wide dynamic range detection of multiple species, capturing the entire desorption event. The Hiden IDP ion desorption probe is a quadrupole mass spectrometer configured for analysis of low energy ions in electron and photon stimulated desorption studies.

XBS Triple Filter Quadrupoles configured for multiple source monitoring in MBE deposition applications. The custom configured ioniser provides for high stability, high senstivity monitoring of oxides and metals from both k-cell and e-gun sources. MBE monitoring and control. Molecular Beam Studies. Multiple beam source analysis. High Performance RGA. Desorption / Outgassing studies / Bakeout cycles. Chamber / Process gas Contaminants. Hiden XBS mass spectrometers for high precision scientific, process applications and MBE analysis, featuring: High Sensitivity, Enhanced detection from 100% to 5ppb, mass range to 510 amu. Enhanced long-term Stability (less than ±0.5% height variation over 24 h). Crossbeam ion source, beam acceptance through +/- 35° to transverse axis. Ion source control for soft ionisation and appearance potential mass spectrometry. Enhanced sensitivity for high mass transmission,

Hiden Ion Milling Probe – End Point Detector The only dedicated end point determination tool for ion etch control and optimum process quality. End point Analysis. Target Impurity Determination. Quality Control / SPC. Residual Gas Analysis. Leak Detection The IMP is a differentially pumped, ruggedized secondary ion mass spectrometer for the analysis of secondary ions and neutrals from the ion mill process, featuring: High Sensitivity SIMS / MS with Pulse Ion Counting Detector. Triple filter Quadrupole, 300 amu mass range is standard. Differentially Pumped Manifold With Mounting Flange to Process Chamber. Ion Optics with Energy Analyser and integral ioniser. Penning Gauge and interlocks to provide over pressure protection. Data System with integration to the process tool. Stability (less than ±0.5% height variation over 24 h). MASsoft control via RS232, RS485 or Ethernet LAN. Programmable DDE, Parallel Digital I / O, RS232 Scripting Communication