k-Space Associates, Inc. products

Harness the power of this patented technology to improve your process control. Measure and control uniformity, thickness, band gap, temperature, surface roughness and more. k-Space manufactures state-of-the-art in situ, real-time thin-film deposition monitoring tools, and has over 25 years of experience in the thin-film metrology field. The application of these proven kSA technologies to in-line PV manufacturing was a natural extension of our product line, as the most promising PV materials are based on thin-film semiconductor materials. Thin-film thickness, uniformity, band gap, and other physical properties are all critical parameters which influence PV device performance and can now be measured during the process. kSA BandiT PV technology is based on real-time spectroscopy of diffusely reflected light from a semiconductor as measured in-line during PV panel manufacturing.