PV-Tools GmbH products

The LOANA system combines various measurement methods in one machine in order to analyze silicon solar cells by pushing a single button.

This tool is designed for the automated IQE analysis of crystalline silicon solar cells.

This table instrument measures mappings of the short circuit current and the reflectance at 6 discrete wavelengths between 405 nm and 1064 nm simultaneously at a speed of 10 ms per pixel. PIXIE calculates these maps into maps of effective diffusion length, base saturation current, dead layer thickness, and current collection probability for surface-generated carriers. The spot size is approximately 100 µm. Intensity variations of the light sources are cancelled out using a monitor detector. We provide costum chucks to make contacting your type of solar cell easy.

This general purpose chuck is intended to be used in self-made measurement setups.