3 products found

Thermo Fisher Scientific, LIMS & Laboratory Software products

Thermo Scientific - Inverted Static Optical Fault Isolation System

The Thermo Scientific Meridian S Inverted Static Optical Fault Isolation System enables Failure Analysis engineers in fabs and service labs to localize electrical faults in semiconductor devices. It offers high-sensitivity Static Laser Stimulation (IR-OBIRCH) and Photon Emission capabilities for the identification of electrical shorts and areas of leakage, in addition to the characterization of device activity via non-destructive analysis. The Meridian S System was designed for upgradability to higher sensitivity Photon Emission and Dynamic OFI techniques to maximize value and productivity.

Thermo Scientific - AX S/TEM for Semiconductor

The Thermo Scientific™ Metrios™ AX S/TEM is a 60–200 kV scanning/transmission electron microscope (S/TEM), designed from the ground up to deliver repeatable TEM- and STEM-based imaging, analytics and gauge capable metrology results at an unprecedented throughput level. With a suite of software that supports everything from productivity-enhancing auto-functions to machine-learning-based navigation and 24/7 automation, the Metrios AX S/TEM ensures success with your challenges today while providing you a roadmap to future design nodes.

Thermo Scientific - Electrical Failure Analysis Systems

Nanoprobing for electrical fault isolation and efficient TEM workflows to improve semiconductor failure analysis. The Thermo Scientific nProber IV System is a high-performance scanning-electron-microscopy-based platform for the localization of transistor and metallization faults. It is our most advanced nanoprobing system to date, and the first to use the high-resolution LEEN2 SEM Column. The nProber IV System is specifically designed to increase the speed, accuracy, and output of your failure analysis (FA) workflow, where productivity is paramount.