Decima - Model CD - Inline Non-Contact Emitter Brochure

The Decima CD measures the emitter sheet resistance within crystalline silicon photovoltaic (PV) wafers. This innovative product is the industry’s most accurate and reliable measurement tool that characterizes diffusion and annealing process results. The Decima CD measures sheet resistance at a series of discrete points along the center track of each wafer. Its patented technology provides accurate real-time measurements for process control and optimization. Each measuring head connects to Aurora’s Veritas™, a quality control system for measurement integration and operations. Veritas enables optimization of diffusion and annealing processes by providing operators and process engineers with real-time 3D visualization of intra-furnace dynamics, both spatially and by batch.