Thermo Scientific - Model nProber IV - Electrical Failure Analysis Systems - Brochure

Our most advanced SEM-based nanoprobing system is the first to use a SEM column designed to meet key, high-end nanoprobing requirements for more successful TEM results on high-density, transistors, interconnects, and complex 3D architectures. The Thermo Scientific™ nProber IV System is a highperformance SEM-based platform for the localization of transistor and metallization faults. It is the most advanced nanoprobing system in the world and the first to use the high-resolution LEEN2™ SEM Column specifically designed to increase speed, accuracy, and output at a critical path in FA workflow, where productivity is paramount.