VLSI - Model NFTS - Silicon Nitride Film Thickness Standards Silicon Wafer Brochure

NOURISH YOUR THIN FILM MEASUREMENT. Use the Silicon Nitride Film Thickness Standard (NFTS) to verify the accuracy of single wavelength or spectroscopic ellipsometers (SWE or SE) and reflectometers. Monitor long term reflectometer or ellipsometer stability in support of ISO and TS accreditation programs, and eliminate the unwanted effects of airborne molecular contamination (AMC) on your metrology.