Pike MappIR - Model II - Automated Sampling Accessory for Semiconductor Wafer Analysis

The MappIR II is an automated sampling accessory for semiconductor wafer analysis, fitting seamlessly into the sample compartment of your FTIR instrument. With its mapping stage, this accessory is an invaluable tool for the semiconductor industry by analyzing EPI, BPSG, and measuring oxygen/carbon content of silicon wafers ranging in size from 2 to 8 inches (50 to 200 mm).