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High Temperature Testing System Equipment & Supplies In Usa Indiana
3 equipment items found
Manufactured by:MPI Corporation based inHsinchu, TAIWAN
MPI Cantilever Probe Card is widely applied on gold bump and pad wafer testing for display driver, logic, and memory device. MPI’s cantilever probes are the corresponding answer to the demands of fine pitch, small pad size, high speed, less cleaning, multi-DUT, high pin count, and ultra-low leakage requirements. With outstanding craftsmanship, innovative architecture and proven ...
Manufactured by:ATMARS INDUSTRTY CO., LIMITED based inDongguan City, CHINA
The high and low-temperature tensile test machine is suitable for testing and analyzing mechanical properties such as tension, compression and bending of metal and non-metal materials in high-temperature, normal-temperature, and low-temperature environments. It has three control methods: stress control, strain control, and displacement ...
Manufactured by:APS Antriebs, Prüf- und Steuertechnik GmbH based inRosdorf, GERMANY
These advanced rock testing plants enable our customers to meet all test requirements in rock research testing. The modular systems can be configured with various types of hydraulic actuators with different load ranges, a variety of test jigs, triaxial cells with different specimen diameter and pressure ranges, pressure controllers as well as different sensors with the necessary ...