TSEC Aegis - Model M-Type -Solar Module

Improve quality: improve the characteristic of the ARC layer to improve the quality of the cells

• Improve the PID effect: the PID (Potential Induced Degradation) effect means that after the cells constitute a solar module or power plant, the potential difference formed by these cell damages the solar cell or module (Leakage path), and then which further results in the decrease of the power generation performance of the cells.
• On the contrary, the feature of the product is to improve the characteristics of the ARC layer (SI-rich), which can effectively improve the anti-PID effect and improve the quality of the cells.
• Increase efficiency: repair surface danglingbonds to better the efficiency of cells
• The danglingbond on the surface of the wafer is just the electron which has yet to form the bonding. The danglingbond has high activity, which tends to form the trap centers and then results in the reconnection of the electron/hole pair. Accordingly, the life of the carriers will be reduced, so the conversion rate will be decreased.
• The feature of the product is to repair the surface danglingbonds by annealing to improve the efficiency of the products.

• TSEC modules pass strict TÜV Rheinland dual-85 PID test for 1000 hours.
• TSEC modules pass Taiwan ITRI salt mist corrosion test for 56 days, which proves TSEC modules can adapt to various poor weathers and environments.
• TSEC modules pass Taiwan ITRI 10,000pa anti-wind pressure and anti-snow pressure test, which proves TSEC modules can adapt to various poor weathers and environments.
• TSEC adopts the current classification method to pervert from hot-spot effect.
•  TSEC adopts 3–stage EL test   
• TSEC modules provide 25-year linear power warranty and 10-year product warranty to improve the overall output performance of the system.