The Impact of Wafer Metrology on Yield Improvement in Semiconductor Production

In semiconductor manufacturing, improving yield—the percentage of good chips produced—is crucial for maximizing efficiency and profitability. One key factor in enhancing yield is wafer metrology. By accurately measuring and analyzing wafers, manufacturers can significantly reduce defects and improve the overall quality of their products. This article explores how wafer metrology contributes to yield improvement and why it’s essential for semiconductor production.