VIEW Micro Metrology articles
In the era of miniaturized, high-performance electronics, the semiconductor chip is only as effective as its packaging. While the spotlight often falls on the chip itself, it is the semiconductor packaging that enables integration into real-world systems.
This article by View Micro Metrology
In semiconductor manufacturing, improving yield—the percentage of good chips produced—is crucial for maximizing efficiency and profitability. One key factor in enhancing yield is wafer metrology. By accurately measuring and analyzing wafers, manufacturers can significantly reduce defects and improve the overall quality of their products. This article explores how wafer metrology contributes to yield improvement and why it’s essential for semiconductor production.