Metrosemi

Metrosemi provides a wide-range of services, including Wafer Defect Inspection, Wafer Stress Measurement and Wafer Thickness Measurement tools in the IC chips an semiconductor manufacturers. Until now, chipmakers have normally purchased separate analytical and traditional optical thickness metrology tools to provide thickness and composition measurements. Aleris family of films metrology systems, beginning with the Aleris 8500 which is the industry’s first system to combine production-worthy composition and multi-layer film thickness metrology. There is some reason behind why people choose METROSEMi for so many days for their metrology products. Satisfied customers through different branch in different countries.