Semiconsoft, Inc.

Semiconsoft, Inc was founded in 2001 with the mission to make data analysis of thin film thickness measurement and n&k easy and transparent to users. TFCompanion software enabled engineers to import ellipsometry, reflectance, transmittance and imaging ellipsometry data and quickly analyze it. TFCompanion was the only software that supported import of measurement data from a wide range of thin film measurement systems. Consistent analysis of the data helped in qualification of the systems. It also helped to determine which system configuration works best for specific application. TFCompanion became a de-facto standard for thin film measurement software. All our systems are designed and manufractured in USA. They are build from the scratch to the highest standards and we take pride in their performance.