Sinton Instruments products

The BLS-I and BCT-400 measurement systems perform bulk lifetime measurements on monocrystalline or multicrystalline silicon (ingots or bricks) without requiring surface passivation. Since lifetime measurements are among the most sensitive techniques for characterizing growth and contamination defects, these tools allow you to assess silicon quality directly after growth. For the flexibility to measure all surface types (from 150-mm diameter to flat) choose the BLS-I. For a compact tool designed to measure only flat surfaces, choose the BCT-400. The BCT-400 can also be mechanically integrated into an automation station and the software can be setup for seamless automated measurements.

WCT-120 and WCT-120MX instruments showcase our unique measurement and analysis techniques, including the highly regarded Quasi-Steady-State Photoconductance (QSSPC) lifetime measurement method developed by Sinton Instruments in 1994.

The WCT-120TS (Temperature Stage) instrument showcases the unique measurement and analysis techniques found with our WCT-120 instrument with the added capability to measure the carrier recombination lifetime of silicon wafers at temperatures ranging from 25°C to 200°C. Both the Quasi-Steady-State Photoconductance (QSSPC) lifetime measurement method developed by Sinton Instruments as well as the transient photoconductance decay technique can be used to measure wafer lifetime with this tool.

The FCT-650 has been designed to have the highest possible accuracy for measuring high-efficiency solar cells. This is done using patented voltage modulation technique to neutralize the capacitive effects in l-V measurements. The Sinton analysis package includes standard cell test outputs. These standard outputs are supplemented with the Suns-Voc analysis that precisely indicates the source of power loss with accurate shunt and series resistance measurements.

The FCT-650SE measurement system is a versatile, steady-state LED l-V tester designed for perovskite on silicon tandem devices. Combining Sinton Instruments` advanced cell characterization techniques with the Sunbrick® Class AAA LED solar simulator by G2V Optics, it reports l-V and Suns-Voc parameters for silicon, perovskite, and tandem devices, as well as substrate doping and lifetime for silicon. Light soaking, maximum power point tracking, and automated measurement sequences are also supported.

The FCT-750 has been designed to have the highest possible accuracy for measuring solar cells, namely high-efficiency cells. This is done using Sinton Instruments` patented voltage modulation technique to neutralize capacitive effects in the l-V measurement. The FCT-750 provides standard cell outputs which are supplemented with a Suns-Voc analysis and a substrate doping determination. All of these parameters are available from a single flash pulse. The option to measure multiple cells simultaneously or measure cut cells is also available.

The FMT instrument has been designed to have the highest possible accuracy for measuring high-efficiency silicon solar modules. This is accomplished using a patented multiflash technology. The standard analysis includes the commonly reported parameters for module testers, but is supplemented with the Suns-Voc analysis that precisely indicates the source of power loss due to shunt and series resistance effects. Over 20 GW of product has been tested to date using the FMT instrument. It is also ideal for R&D because it is suitable to measure any module size from a single-cell coupon to a full-size industrial module.