Sinton Instruments products

The BLS-I and BCT-400 measurement systems perform bulk lifetime measurements on monocrystalline or multicrystalline silicon (ingots or bricks) without requiring surface passivation. Since lifetime measurements are among the most sensitive techniques for characterizing growth and contamination defects, these tools allow you to assess silicon quality directly after growth. For the flexibility to measure all surface types (from 150-mm diameter to flat) choose the BLS-I. For a compact tool designed to measure only flat surfaces, choose the BCT-400. The BCT-400 can also be mechanically integrated into an automation station and the software can be setup for seamless automated measurements.