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- Model HIL606 - 4th Generation Flagship.
Model HIL606 -4th Generation Flagship.
- Plug and Play Upgrade
- Down to 200ns time-step
- Down to 200ns Analog Output update Rate
- 3.5ns GDS oversampling on all Digital Inputs
- 24 Detailed DER Models (3ph)
- M.2 Slot for long-term Data Acquisition
- Back Panel Connectivity (4x Ethernet, 2x EtherCat, 2x CAN FD, 2x QSFP)
Need to model several dual-active bridges together at the highest switching frequencies?
Test many high-switching frequency complex converters with multi-module Si-C based converters between the 50 to 500kHz range at once. With HIL606, you have the nanosecond time resolution and the processing and IO capacity you need to test your full electric drive system.
Run Complex Models in Real-Time at Short Timesteps.
Worried your microgrid models are too complex to integrate real hardware and low-level controllers in your test setup?
The HIL606 supports 24 detailed DER (3PH) models in real-time at once, and at very short timesteps. This means you are extremely well-equipped for simulating full microgrid models at the highest level of detail.
Customize your testbed integration.
Need flexible data rates for your CAN-connected vehicle components? Or just a faster response when connecting to third-party devices?
You can connect and use your HIL testbed with more flexibility than ever, thanks to completely new interfaces like EtherCat, CAN FD, and even an M.2 slot for long-term data storage. Expanded SFP and Ethernet options give you strong support for low-level and time-critical internet-based protocols.
