Endeas QuickSun - Model 130E - High-Performance Cell Tester for Laboratories and Quality Control
QuickSun 130E is a versatile manually operated Xenon flash simulator for testing both ordinary and high capacitance crystalline silicon solar cells. A detailed test report is included with every simulator, proving class A+A+A+ performance with respect to spectrum, irradiance non-uniformity, and short-term instability (STI). The Xenon technology spectrum is continuous, from 300 nm up to 1,200 nm, and it complies without any reservations with the future standard IEC 60904-9 Ed.3. Long-term instability (LTI) is also within class A+ tolerances during the 100 ms long flash pulse – even the high efficiency and capacitance IBC and HJT modules can be measured accurately by applying the Capacitance Compensation (CAC) method.
- Class A+A+A+ solar simulator
- Reliable results for the highest efficiency cells (PERC, HJT, IBC, bifacial)
- Test jig for bifacial cells
- Options: EL imaging, dark reverse IV, and temperature coefficients
Manually operated Kelvin contacted test jig is easily adjustable for crystalline silicon cells having four to six busbars. The cell support plate of the test jig has a very low reflectance making the test jig suitable for bifacial cells.
- Test area 160 mm x 160 mm Customizable up to 320 mm x 420 mm
- Contacting 4-wire / Kelvin 4 – 6 busbars, bifacial
- Load feedback controlled MOSFET adjustable bias 0 – 4.5 V
- Voltage sweep Isc -> Voc, Voc -> Isc Capacitance Compensation (CAC) method
- Voltage measurement 1 – 4 V (other scales on request) Accuracy better than 0.2 %
- Current measurement 0.5 – 25 A (other scales on request) Accuracy better than 0.2 %
- Flash pulse length 100 ms LTI A+
- Irradiance control 200 – 1200 W/m² Resolution 1 W/m²
- Cell temperature control RT – 70 ºC Accuracy 1 ºC
- Pmp repeatability (max-min)/(max+min) < 0.25 % Stdev σ < 0.1 %
- Average flash tube lifetime 500 000 flashes
- Operation temperature 15 – 35 ºC
- Mains utilities 1~, 110 / 230 Vac, 20 / 10 A, 50-60 Hz