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KomaxModel CT45-HV 3kV - High Voltage Test Point Rack Device

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Developed for high voltage testing, the CT45-HV 3kV Rack device is a relay matrix rack with an upgraded CT45 controller designed to incorporate all CS WIN nx® functionalities. The combination of the CT45-HV 3kV Rack device with the CS WIN nx® testing software enables the integration of both low and high voltage technologies in a single application, providing full flexibility. The CT45-HV 3kV Rack device has a management capacity of up to 144 test points and can be combined with the LV test point card bus, making it more versatile. The system is capable of performing a wide range of measurements, including dielectric withstand, insulation test, 4-wire measurement, short-circuit, connection, component, leak, fiber optic attenuation, color detection, and B+ detection. In summary, the combination of the CT45-HV 3kV Rack device and CS WIN nx® testing software provides full flexibility for integrating both low and high voltage technologies in a single application.

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CT45-HV 3kV Rack

Metric

  • Dimensions/height: 134 mm
  • Width: 427 mm
  • Dimensions/depth: 376 mm
  • Weight: 2.9 kg
  • Total power max.: 250 W
  • Ambient temperature, operation min.: 10 °C
  • Ambient temperature, operation max.: 40 °C
  • Ambient temperature, storage min.: -10 °C
  • Ambient temperature, storage max.: 60 °C
  • Air humidity non-condensing min.: 40 %
  • Air humidity non-condensing max.: 75 %
  • Protection class: IP 20
  • Operating height (feet above sea level) max.: 2000 m
  • Test voltage (AC) min.: 22.8 V
  • Test voltage (AC) max.: 25.2 V
  • Test voltage (DC) min.: 20 mV
  • Test voltage (DC) max.: 15 V
  • Test current (DC) max.: 1 A
  • Test points, internal max.: 8
  • Test points, total max.: 136
  • Continuity test via threshold identification min.: 20 Ω
  • Continuity test via threshold identification max.: 10 kΩ
  • Tolerance continuity test, +/- max.: 2 %
  • Short-circuit test via threshold identification min.: 10 kΩ
  • Short-circuit test via threshold identification max.: 1 MΩ
  • Accuracy short-circuit test, +/- max.: 5 %
  • Switch test min.: 20 Ω
  • Switch test max.: 10 kΩ
  • Tolerance switch test, +/-: 2 %
  • Resistance measurement min.: 5 Ω
  • Resistance measurement max.: 1 MΩ
  • Tolerance resistance measurement, +/- max.: 1 %
  • Capacitance measurement min.: 10 nF
  • Capacitance measurement max.: 100 nF
  • Tolerance capacitance measurement, +/- max.: 5 %
  • Diode test max.: 11 V
  • Leak test, depending on start pressure and duration: - Standard: Overpressure / Negative pressure: ja
  • Leak test, depending on start pressure and duration: -Qualified test: overpressure / negative pressure: ja
  • Fiber optic, attenuation, depending on length: ja
  • Color recognition: ja
  • B+ recognition: ja
  • High voltage test (DC) max.: 4000 V
  • High voltage test 2 max.: 3000 V
  • DIO voltage min.: 12 V
  • DIO voltage max.: 24 V
  • Digital outputs: 8
  • Output current (each DO) min.: 0.35 A
  • Output current (each DO) max.: 0.5 A
  • Digital inputs: 8
  • Test software: CS WIN nx ®: ja
  • CT Test software, optional TAS: nein

Imperial

  • Dimensions/height: 5.27 in
  • Width: 16.81 in
  • Dimensions/depth: 14.8 in
  • Weight: 6.39 lb
  • Total power max.: 250 W
  • Ambient temperature, operation min.: +50 °F
  • Ambient temperature, operation max.: +104 °F
  • Ambient temperature, storage min.: +14 °F
  • Ambient temperature, storage max.: +140 °F
  • Air humidity non-condensing min.: 40 %
  • Air humidity non-condensing max.: 75 %
  • Protection class: IP 20
  • Operating height (feet above sea level) max.: 6561 ft
  • Test voltage (AC) min.: 22.8 V
  • Test voltage (AC) max.: 25.2 V
  • Test voltage (DC) min.: 20 mV
  • Test voltage (DC) max.: 15 V
  • Test current (DC) max.: 1 A
  • Test points, internal max.: 8
  • Test points, total max.: 136
  • Continuity test via threshold identification min.: 20 Ω
  • Continuity test via threshold identification max.: 10 kΩ
  • Tolerance continuity test, +/- max.: 2 %
  • Short-circuit test via threshold identification min.: 10 kΩ
  • Short-circuit test via threshold identification max.: 1 MΩ
  • Accuracy short-circuit test, +/- max.: 5 %
  • Switch test min.: 20 Ω
  • Switch test max.: 10 kΩ
  • Tolerance switch test, +/-: 2 %
  • Resistance measurement min.: 5 Ω
  • Resistance measurement max.: 1 MΩ
  • Tolerance resistance measurement, +/- max.: 1 %
  • Capacitance measurement min.: 10 nF
  • Capacitance measurement max.: 100 nF
  • Tolerance capacitance measurement, +/- max.: 5 %
  • Diode test max.: 11 V
  • Leak test, depending on start pressure and duration: - Standard: Overpressure / Negative pressure: ja
  • Leak test, depending on start pressure and duration: -Qualified test: overpressure / negative pressure: ja
  • Fiber optic, attenuation, depending on length: ja
  • Color recognition: ja
  • B+ recognition: ja
  • High voltage test (DC) max.: 4000 V
  • High voltage test 2 max.: 3000 V
  • DIO voltage min.: 12 V
  • DIO voltage max.: 24 V
  • Digital outputs: 8
  • Output current (each DO) min.: 0.35 A
  • Output current (each DO) max.: 0.5 A
  • Digital inputs: 8
  • Test software: CS WIN nx ®: ja
  • CT Test software, optional TAS: nein