Topsil - Model FZ-UHPS -Uniform High Purity Silicon for Silicon Drift Detectors

Topsil has designed a unique uniform float zone based high purity silicon substrate (UHPS) with tight resistivity tolerance performing up to unprecedented level. The substrate targets high resolution x-ray, particle and optical detectors. The silicon wafers allow for higher energy resolution and shorter shaping times of detectors used in e.g. space science, crystallography and the medical industry.