thin film characterization News
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Optical Characterization of CIGS by Spectroscopic Ellipsometry
Spectroscopic Ellipsometry is an efficient and non-destructive method for extracting optical constants of materials in the UV-VIS-NIR wavelength ranges. The optical constants (n,k) of a material are among the most important sets of optical data and are specific to the material being studied. During this webinar, you will learn how to define a strategy to perform quantitative Spectroscopic ...
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NREL, German solar energy researchers to work together
Scientists from the two nations to collaborate on next-generation PV and fuels German and American researchers will work together more closely on solar energy topics as a result of today’s signing of a Memo of Understanding (MOU) between the U.S. Department of Energy’s National Renewable Energy Laboratory (NREL) and the German Helmholtz Association. The MOU identifies several key ...
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Solar Lab collaborative showcase on August 4
Tours and one-on-one meetings with scientists offered at NREL’s Process Development Integration Laboratory One-of-a-kind platforms that have the ability to bridge the gap between photovoltaic (PV) module and cell efficiencies are opening their stainless steel arms to industry, academia, stakeholders , and other entities on Aug. 4 at a Collaborative Showcase at the Process Development ...
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